Cryogenic operation of sub-30 nm nMOSFETs: Impact of device architecture G. Bertrand, S. Deleonibus, D. Souil, B. Previtali, C. Caillat, G. Guégan, M. Sanquer et F. BalestraJ. Phys. IV France, 12 3 (2002) 45-49DOI: https://doi.org/10.1051/jp420020034
