Characterization of D-T cryogenic layer formation in a Beryllium capsule using X-ray phase contrast imaging D.S. Montgomery, D.C. Gautier, B.J. Kozioziemski, J.D. Moody, S.C. Evans, J. Pipes, J.D. Sater, D. Stefanescu et P.J. WalshJ. Phys. IV France, 133 (2006) 869-873DOI: https://doi.org/10.1051/jp4:2006133175
