Characterisation of metal-organic semiconductor interfaces: In and Sn on CuPc V.Yu. Aristov, O.V. Molodtsova, V.M. Zhilin, D.V. Vyalikh et M. KnupferJ. Phys. IV France, 132 (2006) 101-104DOI: https://doi.org/10.1051/jp4:2006132020
