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The (3 2) -SiC(001) surface reconstruction investigated by photoelectron diffraction in the backscattering regime

E.G. Michel, D. Dunham, A. Tejeda, P. Soukiassian, E. Rotenberg et J.D. Denlinger

J. Phys. IV France, 132 (2006) 49-55

DOI: https://doi.org/10.1051/jp4:2006132010

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