Dental depth profilometric diagnosis of pit & fissure caries using frequency-domain infrared photothermal radiometry and modulated laser luminescence R.J. Jeon, A. Mandelis, V. Sanchez et S.H. AbramsJ. Phys. IV France, 125 (2005) 741-744DOI: https://doi.org/10.1051/jp4:2005125170