High resolution thermoreflectance imaging on transistor arrays with defect-induced leakage G. Tessier, C. Filloy, M.L. Polignano, I. Mica, G. Jerosolimski, S. Holé et D. FournierJ. Phys. IV France, 125 (2005) 423-425DOI: https://doi.org/10.1051/jp4:2005125099
