Thermoreflectance measurements on test microelectronic devices at several probe wavelengths: Comparison between CCD and focused laser techniques L.R. de Freitas, A.M. Mansanares, E.C. da Silva, M.C.B. Pimentel, S. Finco, G. Tessier et D. FournierJ. Phys. IV France, 125 (2005) 121-124DOI: https://doi.org/10.1051/jp4:2005125028
