Phase-contrast microtomography using an X-ray interferometer having a 40-μm analyzer A. Momose, I. Koyama, Y. Hamaishi, H. Yoshikawa, T. Takeda, J. Wu, Y. Itai, , K. Takai, K. Uesugi et Y. SuzukiJ. Phys. IV France, 104 (2003) 599-602DOI: https://doi.org/10.1051/jp4:20030153
