Applications of phase-contrast X-ray microscopy in an SEM S.C. Mayo, P.R. Miller, S.W. Wilkins, T.J. Davis, D. Gao, T.E. Gureyev, D. Paganin, D.J. Parry, A. Pogany et A.W. StevensonJ. Phys. IV France, 104 (2003) 543-546DOI: https://doi.org/10.1051/jp4:20030140
