Imaging of patterned self-assembled monolayers by scanning photoelectron microscopy R. Klauser, M. Zharnikov, I.-H. Hong, S.-C. Wang, A. Gölzhäuser et T.J. ChuangJ. Phys. IV France, 104 (2003) 459-462DOI: https://doi.org/10.1051/jp4:20030122
