Nano-tomography based on hard X-ray microscopy with refractive lenses C.G. Schroer, J. Meyer, M. Kuhlmann, B. Benner, T.F. Günzler, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev et I. SnigirevaJ. Phys. IV France, 104 (2003) 271DOI: https://doi.org/10.1051/jp4:200300078
