Table-top X-ray microscopy : Sources, optics and applications H.M. Hertz, G.A. Johansson, H. Stollberg, J. de Groot, O. Hemberg, A. Hotmberg, S. Rehbein, P. Jansson, F. Eriksson et J. BirchJ. Phys. IV France, 104 (2003) 115-119DOI: https://doi.org/10.1051/jp4:200300041