A scanning photoelectron microscope for materials science spectromicroscopy at the Pohang Light Source H.J. Shin, M.K. Lee, G.B. Kim, C.K. Hong, J.Y. Lee, J.W. Kim, S.M. Park, Y.S. Roh et K. JeongJ. Phys. IV France, 104 (2003) 67-70DOI: https://doi.org/10.1051/jp4:200300031
