The 2-ID-B intermediate-energy scanning X-ray microscope
at the APS
I. McNulty, D. Paterson, J. Arko, M. Erdmann, S.P. Frigo, K. Goetze, P. Ilinski, N. Krapf, T. Mooney, C.C. Retch, A.P.J. Stampfl, S. Vogt, Y. Wang et S. Xu
J. Phys. IV France, 104 (2003) 11-15
DOI: https://doi.org/10.1051/jp4:200300019
