GAXRD and in situ X-ray diffraction characterizations of the yttrium implantation effect on pure iron oxidation at high temperature E. Caudron, H. Buscail, R. Cueff, C. Issartel, S. Perrier et F. RiffardJ. Phys. IV France, 12 6 (2002) 417-426DOI: https://doi.org/10.1051/jp4:20020250
