Volatility studies on single source precursors for LaNiO3 film deposition: Mass spectrometry and thermal analysis N. Kuzmina, I. Malkerova, M. Ryazanov, A. Alikhanyan, A. Rogachev et A. N. GleizesJ. Phys. IV France, 11 PR3 (2001) Pr3-661-Pr3-667DOI: https://doi.org/10.1051/jp4:2001384
