Spectral ellipsometry of La1-xMnO3 films with different degree of epitaxy G.-J. Babonas, A. Reza, K. Fröhlich, M. Pripko et D. MachajdikJ. Phys. IV France, 11 PR11 (2001) Pr11-181-Pr11-185DOI: https://doi.org/10.1051/jp4:20011129
