Electron diffraction (LACBED) and HRTEM Moiré fringe pattern study of stress in YBaCuO thin film on Mg0 F. Pailloux et R. J. GaboriaudJ. Phys. IV France, 10 PR6 (2000) Pr6-131-Pr6-135DOI: https://doi.org/10.1051/jp4:2000623
