Influence of layer interface parameters on dielectric characteristics of BSTO ferroelectric film planar capacitors A. I. Dedyk, S. F. Karmanenko, S. Leppavuori, V. I. Sakharov, A. A. Semenov, I. T. Serenkov, L. T. Ter-Martirosyan, A. Uusimak et F. WangJ. Phys. IV France, 08 PR9 (1998) Pr9-217-Pr9-220DOI: https://doi.org/10.1051/jp4:1998941
