The electrical assessment of Si1-xGex/Si heterostructures V. S. Lysenko, I. P. Tyagulski, Y. V. Gomeniuk, I. N. Osiyuk, C. J. Patel, O. Nur et M. WillanderJ. Phys. IV France, 08 PR3 (1998) Pr3-87-Pr3-90DOI: https://doi.org/10.1051/jp4:1998320