An automatic method of measuring the cristallographic orientations of Fe-Si alloys using electron scan microscope image processing and etch pitting J.-P. Goglio, A. Chehikian, T. Waeckerlé et B. CornutJ. Phys. IV France, 08 PR2 (1998) Pr2-677-Pr2-680DOI: https://doi.org/10.1051/jp4:19982157
