An In Situ Reflection Mode Quick Scanning EXAFS Study of Anodic Oxide Layer Formation on Silver D. Hecht, P. Borthen, R. Frahm et H.-H. StrehblowJ. Phys. IV France, 7 C2 (1997) C2-717-C2-722DOI: https://doi.org/10.1051/jp4:1997218
