XAFS Studies of Self-Aligned Platinum Silicide Thin Films at the Pt M3,2 Edge and the Si K-Edge S. J. Naftel, A. Bzowski, T. K. Sham, D.-X. Xu et S. R. DasJ. Phys. IV France, 7 C2 (1997) C2-1131-C2-1132DOI: https://doi.org/10.1051/jp4:19972158
