Evolution of Interface Structure in Ni-C Multilayers Depending on Annealing Temperature : Use of Embedded Co Sublayers-Markers V. A. Chernov, N. I. Chkhalo et S. G. NikitenkoJ. Phys. IV France, 7 C2 (1997) C2-699-C2-700DOI: https://doi.org/10.1051/jp4:1997209
