Structural Characterization of Thin Films and Multilayer Structures
K. Temst, M. J. Van Bael, M. Baert, E. Rosseel, V. Bruyndoncx, C. Strunk, G. Verbanck, K. Mae, C. Van Haesendonck, V. V. Moshchalkov, Y. Bruynseraede, R. Jonckheere, D. G. de Groot, N. Koeman et R. Griessen
J. Phys. IV France, 06 C3 (1996) C3-265-C3-270
DOI: https://doi.org/10.1051/jp4:1996340
