Characterization of two-dimensional Er-silicide / Si (111) interface M. H. Tuilier, G. Gewinner, C. Pirri, P. Wetzel, D. Bolmont et O. HeckmannJ. Phys. IV France, 04 C9 (1994) C9-187-C9-190DOI: https://doi.org/10.1051/jp4:1994932
