On the use of the modulated reflectance microscopy in the study of laser diode facets : detection of surface defects A. M. Mansanares, J. P. Roger, D. Fournier et A. C. BoccaraJ. Phys. IV France, 04 C7 (1994) C7-207-C7-210DOI: https://doi.org/10.1051/jp4:1994750
