Characterization of inhomogeneous weakly absorbing thin films by photothermal deflection spectroscopy, applications to hydrogenated amorphous silicon films L. Chahed, J. M. Frigerio, F. Jérémie et M. L. ThèyeJ. Phys. IV France, 04 C7 (1994) C7-121-C7-124DOI: https://doi.org/10.1051/jp4:1994729
