Investigation of laser-induced damage at 248 nm in oxide thin films with a pulsed photoacoustic mirage technique J. Siegel, M. Reichling, E. Matthias, E. Hacker et H. LauthJ. Phys. IV France, 04 C7 (1994) C7-745-C7-748DOI: https://doi.org/10.1051/jp4:19947175
