Micrometer resolved inspection of defects and laser damage sites in UV high-reflecting coatings by photothermal displacement microscopy A. Bodemann, N. Kaiser, M. Reichling et E. WelschJ. Phys. IV France, 04 C7 (1994) C7-611-C7-614DOI: https://doi.org/10.1051/jp4:19947144
