Photothermal reflectance microscopy : signal contrast in the case of thick and thin grain interfaces in solids A. M. Mansanares, Z. Bozoki, T. Velinov, D. Fournier et A. C. BoccaraJ. Phys. IV France, 04 C7 (1994) C7-575-C7-578DOI: https://doi.org/10.1051/jp4:19947135
