Characterizing faulted dipoles in TiAl with electron microscopy and computed image simulations B. VIGUIER, K. J. HEMKER, R. SCHÄUBLIN et J. L. MARTINJ. Phys. IV France, 03 C7 (1993) C7-441-C7-444DOI: https://doi.org/10.1051/jp4:1993768
