CHARACTERIZATION OF MULTILAYERS ADHERENCE ON GaAs SUBSTRATE BY INFRARED IMAGING AND CORRELATION TO ASSOCIATED MICROSCOPY STUDIES J. M. TEILLERIE, M. THOLOMIER et J.E BRESSEJ. Phys. IV France, 01 C6 (1991) C6-253-C6-257DOI: https://doi.org/10.1051/jp4:1991639
