INFRARED LBIC SCAN MAPS APPLIED TO ALUMINIUM GETTERED MULTICRYSTALLINE SILICON WAFERS J. Y. NATOLI, M. PASQUINELLI, F. FLORET et S. MARTINUZZIJ. Phys. IV France, 01 C6 (1991) C6-237-C6-238DOI: https://doi.org/10.1051/jp4:1991637
