Si-O-Si Angle Distribution in Amorphous Silica Characterized by EXAFS Multiple Scattering Calculations A. Moen, L. Le Noc, D. T. On, L. Bonneviot, L. Lévesque et D. RoyJ. Phys. IV France, 7 C2 (1997) C2-275-C2-276DOI: https://doi.org/10.1051/jp4/1997198
