Extended X-Ray Characteristic Fluorescence Fine Structure above the K-Edge of Ni and NiO by Fast Electron Excitation V. Alexandrov, A. Zadorozhny et V. SkudraJ. Phys. IV France, 7 C2 (1997) C2-215-C2-216DOI: https://doi.org/10.1051/jp4/1997168
