Comparison between Electron Yield, PSD Ion Yield, and Surface Pipico Yield in Near C and O K-Edge XAFS in Condensed Methyl Formate-D T. Selriguehi, H. L. Sekiguchi, K. Obi et K. TanakaJ. Phys. IV France, 7 C2 (1997) C2-505-C2-506DOI: https://doi.org/10.1051/jp4/1997071
