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Phase-contrast microtomography using an X-ray interferometer having a 40-μm analyzer

A. Momose, I. Koyama, Y. Hamaishi, H. Yoshikawa, T. Takeda, J. Wu, Y. Itai, , K. Takai, K. Uesugi, Y. Suzuki

J. Phys. IV France, 104 (2003) 599-602

DOI: https://doi.org/10.1051/jp4:20030153

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