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In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation
Muriel Thomasset, Thierry Moreno, Blandine Capitanio, Mourad Idir and Samuel Bucourt Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 616(2-3) 197 (2010) https://doi.org/10.1016/j.nima.2009.12.034
X-ray diffraction on the aperture and subsequent propagation with a 2D-bounded wavefront
A.-M. Flank, G. Cauchon, P. Lagarde, S. Bac, M. Janousch, R. Wetter, J.-M. Dubuisson, M. Idir, F. Langlois, T. Moreno and D. Vantelon Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 246(1) 269 (2006) https://doi.org/10.1016/j.nimb.2005.12.007