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Cited article:

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

Noritake Isomura, Keiichiro Oh-ishi, Naoko Takahashi and Satoru Kosaka
Journal of Synchrotron Radiation 28 (6) 1820 (2021)
https://doi.org/10.1107/S1600577521009401

NEXAFS Sensitivity to Bond Lengths in Complex Molecular Materials: A Study of Crystalline Saccharides

Adrian Gainar, Joanna S. Stevens, Cherno Jaye, Daniel A. Fischer and Sven L. M. Schroeder
The Journal of Physical Chemistry B 119 (45) 14373 (2015)
https://doi.org/10.1021/acs.jpcb.5b07159

High resolution soft X-ray absorption spectroscopy for the chemical state analysis of Mn

Jun Kawai, Yoshinobu Mizutani, Tetsuro Sugimura, Makoto Sai, Tohru Higuchi, Yoshihisa Harada, Yoichi Ishiwata, Akiko Fukushima, Masami Fujisawa, Masamitsu Watanabe, Kuniko Maeda, Shik Shin and Yohichi Gohshi
Spectrochimica Acta Part B: Atomic Spectroscopy 55 (9) 1385 (2000)
https://doi.org/10.1016/S0584-8547(00)00238-X