Numéro |
J. Phys. IV France
Volume 104, March 2003
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|
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Page(s) | 579 - 582 | |
DOI | https://doi.org/10.1051/jp4:20030148 |
J. Phys. IV France 104 (2003) 579
DOI: 10.1051/jp4:20030148
Simulation of coherent image formation in a hard X-ray CRL microscope
T. Weitkamp1, 2, C. Rau1, A. Snigirev1, B. Benner2, 3 and C.G. Schroer31 Experiments Division, European Synchrotron Radiation Facility, ESRF, BP. 220, 38043 Grenoble cedex, France
2 Paul Sherrer Institut, 5232 Villigen, Switzerland
3 Physikalisches Institut B, Rheinisch-Westfälische Technische Hochschule (RWTH) 52056 Aachen, Germany
Abstract
A computer program for modeling image formation in a hard X-ray microscope is presented.
The experimental setup is represented by a sequence of thin objects representing optical
elements and the test sample, and free drift spaces through which the wavefront is propagated
using scalar Fresnel propagation techniques in paraxial approximation. X-ray optical properties
of the materials that make up the objects in the beam path are automatically looked up in
tabulatedata. The program reproduces experimentally gathered micrographs and helps understand
contrast features. A method for calculating cases of partially coherent or incoherent illumination
is presented.
© EDP Sciences 2003