Numéro
J. Phys. IV France
Volume 104, March 2003
Page(s) 579 - 582
DOI https://doi.org/10.1051/jp4:20030148


J. Phys. IV France
104 (2003) 579
DOI: 10.1051/jp4:20030148

Simulation of coherent image formation in a hard X-ray CRL microscope

T. Weitkamp1, 2, C. Rau1, A. Snigirev1, B. Benner2, 3 and C.G. Schroer3

1  Experiments Division, European Synchrotron Radiation Facility, ESRF, BP. 220, 38043 Grenoble cedex, France
2  Paul Sherrer Institut, 5232 Villigen, Switzerland
3  Physikalisches Institut B, Rheinisch-Westfälische Technische Hochschule (RWTH) 52056 Aachen, Germany


Abstract
A computer program for modeling image formation in a hard X-ray microscope is presented. The experimental setup is represented by a sequence of thin objects representing optical elements and the test sample, and free drift spaces through which the wavefront is propagated using scalar Fresnel propagation techniques in paraxial approximation. X-ray optical properties of the materials that make up the objects in the beam path are automatically looked up in tabulatedata. The program reproduces experimentally gathered micrographs and helps understand contrast features. A method for calculating cases of partially coherent or incoherent illumination is presented.



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