| Numéro |
J. Phys. IV France
Volume 10, Numéro PR7, May 2000
International Workshop on Dynamics in Confinement
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|---|---|---|
| Page(s) | Pr7-247 - Pr7-250 | |
| DOI | https://doi.org/10.1051/jp4:2000749 | |
International Workshop on Dynamics in Confinement
J. Phys. IV France 10 (2000) Pr7-247-Pr7-250
DOI: 10.1051/jp4:2000749
Department of Chemical Engineering, University of Amsterdam, Nieuwe Achtergracht 166, 1018 WWAmsterdam, The Netherlands
© EDP Sciences 2000
J. Phys. IV France 10 (2000) Pr7-247-Pr7-250
DOI: 10.1051/jp4:2000749
Glass transition of ultrathin films probed by X-ray reflectivity
E. Cecchetto, N.R. de Souza and B. JérômeDepartment of Chemical Engineering, University of Amsterdam, Nieuwe Achtergracht 166, 1018 WWAmsterdam, The Netherlands
Abstract
X-ray reflectometry was used to measure the temperature dependence of the thickness of ultrathin films
of two low-molecular-weight glass formers. In bulk samples, this type of measurements reveals the presence of a
glass transition by a sudden break of slope. We have observed a broadening of the glass transition in films thinner
than roughly 150 nm, indicating an inhomogeneous distribution of relaxation times in these films. Our results are
explained by confinement effect and interpreted in the frame of a theoretical model based on the concept of
collective dynamics over a cooperative length.
© EDP Sciences 2000