Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-757 - C2-758
DOI https://doi.org/10.1051/jp4:1997227
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-757-C2-758

DOI: 10.1051/jp4:1997227

The XAFS Phase Isolation and Characterization of Dispersion Phase Structure

X. Cai1, X. Chai1, Y. Xie1, Z. Ren1, C. Lin1, L. Yang1, Y. Tang1 and T. Tanaka2

1  Department of Chemistry, Peking University, Beijing 100871, P.R. China
2  Department of Molecular Engineering, Kyoto University, Sakyo-ku, Kyoto 606-01, Japan


Abstract
According to Lu Kunquan's XAFS formula for mixing phase system, it is impossible to get the true structure of this kind of system by usual data analysis. A method which combines Lu Kunquan's XAFS formula with XRD was proposed to isolate XAFS of crystalline and dispersed phases. NiO/γAl2O3 system is prepared by mixing NiO and completely dispersed NiO/γAl2O3, and dealt by this method. The obtained coordination parameters of dispersed phase is just as same as the actual value. It demonstrates that the method of the phase isolation is reasonable and practicable.



© EDP Sciences 1997