Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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Page(s) | C2-1097 - C2-1099 | |
DOI | https://doi.org/10.1051/jp4:19972146 |
J. Phys. IV France 7 (1997) C2-1097-C2-1099
DOI: 10.1051/jp4:19972146
Diffuse Interface and Strain Anisotropy in Co/Pd(111) Multilayers by Polarized EXAFS Study
S.-K. Kim1, Y.-M. Koo2 and V.A. Chernov31 Experimental System Group, Advanced Light Source, Lawrence Berkeley Laboratory, 1 Cyclotron Road, CA 94720, U.S.A.
2 Department of Materials Science and Technology, Pohang University of Science and Technology (POSTECH), Pohang 790-784, South Korea
3 Siberian Synchrotron Radiation Center (SSRC) of Budker Institute of Nuclear Physics (BINP), Institute of Catalysis, Novosibirsk 630090, Russia
Abstract
We examined interface structure of Co/Pd multilayers by quantitative analysis of fluorescence-yield Co K-edge EXAFS. To investigate the local atomic structure surrounding Co absorber and its anisotropy in orthogonal directions, two polarization dependent set-ups were used. By means of first shell analysis including distinct nearest neighbors of Co and Pd atoms, it was found that a considerable amount of Co-Pd alloy-tike phase near interfaces of thin Co layers is formed by atomic scaled diffuseness of growing surface. Moreover, we found Co strain anisotropy depending on Co layer thickness, generally, tensile and compressive strains of in-plane and out-of-plane atoms, respectively. These interface structures might critically affect the tendency of perpendicular magnetization in Co/Pd multilayers.
© EDP Sciences 1997