Numéro |
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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Page(s) | C7-717 - C7-720 | |
DOI | https://doi.org/10.1051/jp4:19947168 |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-717-C7-720
DOI: 10.1051/jp4:19947168
1 IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099, U.S.A.
2 Institute of Physical Chemistry, University of Heidelberg, Im Neuenheimer Feld 253, 69120 Heidelberg, Germany
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-717-C7-720
DOI: 10.1051/jp4:19947168
The elastic modulii of evaporated C60 films
H. Coufal1, K. Meyer1, R.K. Grygier1, M. de Vries1, D. Jenrich2 and P. Hess21 IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099, U.S.A.
2 Institute of Physical Chemistry, University of Heidelberg, Im Neuenheimer Feld 253, 69120 Heidelberg, Germany
Abstract
Surface acoustic wave (SAW) pulses were excited in C60 films on a variety of substrates using pulses from Excimer lasers for excitation. An optical beam deflection technique and polymer electret transducers were utilized to detect the propagation of the SAW pulse with high spatial and temporal resolution, allowing an accuracy of better than 0.1% for SAW velocity measurements. With this technique the frequency dependence of the SAW velocity was determined for fullerite films and density, as well as elastic modulii of the films were derived by a theoretical analysis of the dispersion effect.
© EDP Sciences 1994