Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-231 - C2-232
DOI https://doi.org/10.1051/jp4/1997176
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-231-C2-232

DOI: 10.1051/jp4/1997176

Multiple Scattering EXAFS and EXELFS Study of Al3Ti and Ti3Al Alloys

T. Sikora1, G. Hug1, M. Jaouen2 and J.J. Rehr3

1  Laboratoire d'Études des Microstructures, ONERA-CNRS, BP. 72, 92322 Châtillon, France
2  Laboratoire de Métallurgie Physique, URA 131 du CNRS, Bd. 3 Téléport 2, BP. 179, 86960 Futuroscope, France
3  University of Washington, Seattle, WA 98195, U.S.A.


Abstract
Extended X-ray absorption Fine Structure (EXAFS) and Extended Energy Loss Fine Structure (EXELFS) spectroscopies have been used to study the local atomic order of Al3Ti and Ti3Al. Using the multiple scattering code FEFF6, we will show that now EXAFS can be considered as a probe for medium range order studies. The limitations of this new way of using EXAFS are briefly discussed.



© EDP Sciences 1997