| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|
|
|---|---|---|
| Page(s) | C2-209 - C2-210 | |
| DOI | https://doi.org/10.1051/jp4/1997165 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-209-C2-210
DOI: 10.1051/jp4/1997165
European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex 9, France
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-209-C2-210
DOI: 10.1051/jp4/1997165
XAID: A Package for XAFS Data Analysis Based on IDL
M. Sánchez del RìoEuropean Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex 9, France
Abstract
A set of IDL functions and procedures to perform basic XAFS data analysis has been developed. XAID provides the
necessary tools to perform background substraction, Fourier transforms, Fourier filtering, etc. The library routines can be used as
modules to be included in the users's customized programs or for creating widget applications. Stand-alone main programs and
Graphical User Interfaces to perform standard data analysis are also presented.
© EDP Sciences 1997