Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-187 - C2-189
DOI https://doi.org/10.1051/jp4/1997159
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-187-C2-189

DOI: 10.1051/jp4/1997159

Grazing Incidence X-Ray Absorption Spectroscopy of Near Surface Regions: Possibilities and Limitations

P. Borthen and H.-H. Strehblow

Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universtät Düsseldorf, Universitätsstrasse 1, 40225 Düsseldorf, Germany


Abstract
The application of the grazing incidence X-ray absorption spectroscopy (GIXAS) to the investigations of near surface regions of layer systems is discussed. Starting with transmission standards, GIXAS spectra for different detection modes were calculated as functions of the grazing angle, layer composition and surface/interface roughness. For systems consisting of only one layer that participates to the XAFS signal, the fine structructure is a linear superposition of the fine structures in the real and the imaginary part of the energy dependent refractive index. The surface roughness iess than about 2 nm does not significantely reduce the surface sensitivity of the method. An example of near surface structure determination for an oxidized metal surface is given.



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