Numéro
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-383 - C2-387
DOI https://doi.org/10.1051/jp4/1997026
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-383-C2-387

DOI: 10.1051/jp4/1997026

In Situ MCD Magnetometry in the Ultrathin Limit: Fe on Cu(100)

J. Hunter Dunn1, D. Arvanitis2 and N. Märtensson1

1  Department of Physics, University of Uppsala, Box 530, 751 21 Uppsala, Sweden
2  Department of Physics, University of Uppsala, Box 530, 751 21 Uppsala Sweden


Abstract
By means of Magnetic Circular Dichroism in X-ray Absorption Sectroscopy we investigated the magnetic properties of fet Fe tilms stabilised by epitaxial growth on the Cu(100) surface. These are compared to bee like Fe films. The films were characterised in situ by means of LEED, AES and XAS for order and cleanness. Low temperature (≈ 50 K) and angle dependent measurements are reported for thickneses around 3.5 (fct (5 × 1) phase) and 20 (bee phase) monolayers. A much stronger MCD response is obtained from the thimner films (perpendicular magnetisation). The MCD sum rules enabled as to dertermiine the orbital and spin contributions to the magnetic moment for the two phases. The results are compared to theory.



© EDP Sciences 1997