| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-347 - C2-352 | |
| DOI | https://doi.org/10.1051/jp4/1997015 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-347-C2-352
DOI: 10.1051/jp4/1997015
1 Research Institute for Scientific Measurements, Katahira 2-1-1, Sendai, 980-77, Japan
2 Research Institute for Scientific Measurements, Katahira 2-1-1, Sendai, 980-77 Japan
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-347-C2-352
DOI: 10.1051/jp4/1997015
X-Ray Raman Spectra from Low-Z Elements
Y. Udagawa1, N. Watanabe2 and H. Hayashi11 Research Institute for Scientific Measurements, Katahira 2-1-1, Sendai, 980-77, Japan
2 Research Institute for Scientific Measurements, Katahira 2-1-1, Sendai, 980-77 Japan
Abstract
X-ray Raman and Compton scattering spectra from compounds consisting of low-Z elements have been measured over
a wide range of momentum and energy transfer. An anisotropy study on BN single crystal shows that X-ray Raman spectroscopy is
useful in studies of excited electronic states and is complementary to soft X-ray K absorption spectroscopy. Generalized oscillator
strengh can also be determined by inelastic X-ray scattering spectra due to L electrons, and applications for various studies are
discussed.
© EDP Sciences 1997